The great achievements were achieved in the manufacturing of uncooled microbolometer infrared focal plane arrays(UFPA). By this technique infrared system can be made in the formation of small volume, light weight, low price and being portable. It promotes greatly the utilization of infrared system in many fields. The main disadvantage of UFPA is non-uniformity. Despite non-uniformity of UFPA has been greatly improved, non-uniformity still restricts the performance of uncooled infrared system. In this paper, the attention is focused on the technology and methods measuring the non-uniformity of UFPA. The system that can measure the non-uniformity of UFPA and evaluate the image processing algorithms is developed. The measurement system consists of blackbody, infrared optics, control units, processing circuit, high-speed A/D converter, computer and software. To obtain the output signals of UFPA, the drive circuit and control circuit of thermoelectric stabilizer(TEC) of UFPA are developed. In the drive circuit, the CPLD device is employed to insure a small size circuit. In the TEC circuit, a kind of highly integrated and cost-effective, high-effiency, switch-mode driver is used to insure temperature stability of 0.01°C. The system is used to measure non-uniformity of microbolometer detectors which are produced by ULIS company. It can also present the evaluation of algorithm. The results are given and analyzed.