11 January 2005 Sensitive detection of ultrafast multitransitional spectral patterns by using optical spectrogram scope (OSS)
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An ultra-short pulse is very useful as a tool for various applications because of its ultra-short temporal duration, ultra-high bandwidth, and ultra-high peak power. In general, in the pulse measurement by using current methods, the retrieved signal pulse is influenced by properties of a detector used in the measurement system. For example, a noise is added to acquisition data by a dark current of the detector. In current methods, post calculation for acquisition data cannot eliminate all of the deviations caused by the detector absolutely, so that we must retrieve the signal pulse from the deviant data. On the other hand, as a pulse measurement system capable of applying optical signal processing, we have proposed optical spectrogram scope (OSS). OSS is a pulse measurement system based on an optical correlation technique. In the OSS system, processing based on the optical correlation technique is implemented by using an optical filtering technique. Then, by designing the optical filter used in the OSS system, we can promptly implement various processing based on the optical correlation technique. For example, to inhibit the influence of properties of the detector at the minimum, we have proposed a new method using previous analysis before acquisition. In this method, we introduce ideas of optical signal processing into the pulse measurement system. To demonstrate the proposed method of sensitive detection of multi-transitional spectral patterns by using OSS, we executed preliminary experiments. In our experiment, we measured a signal pulse containing two signal components of different transitional spectral patterns.
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Tsuyoshi Konishi, Tsuyoshi Konishi, Kazunori Tanimura, Kazunori Tanimura, Takehito Oonishi, Takehito Oonishi, Kazuyoshi Itoh, Kazuyoshi Itoh, "Sensitive detection of ultrafast multitransitional spectral patterns by using optical spectrogram scope (OSS)", Proc. SPIE 5642, Information Optics and Photonics Technology, (11 January 2005); doi: 10.1117/12.565206; https://doi.org/10.1117/12.565206

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