The advanced nanofabrication technology

Ming Liu; Qiuxia Xu; Baoqin Chen; Changqing Xie; Tianchun Ye; Xinchun Liu

doi:10.1117/12.570206

27 January 2005 The advanced nanofabrication technology

Ming Liu; Qiuxia Xu; Baoqin Chen; Changqing Xie; Tianchun Ye; Xinchun Liu

Author Affiliations +

Proceedings Volume 5645, Advanced Microlithography Technologies; (2005) https://doi.org/10.1117/12.570206
Event: Photonics Asia, 2004, Beijing, China

Abstract

Some research results in advanced optical lithography, Electron beam lithography, X-ray lithography are introduced in this paper. For advanced optical lithography, optical proximity correction and phase-shift masking (PSM) are studied, and 150nm pattern is achieved by i-line Stepper using transparent PSM. For e-beam lithography, the resist process, proximity effect correction and mix & match technologies are investigated, and 27nm CMOS device is successfully fabricated. The 0.15μm GaAs PHEMT devices are successfully fabricated by employing X-ray lithography.

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Ming Liu, Ming Liu, Qiuxia Xu, Qiuxia Xu, Baoqin Chen, Baoqin Chen, Changqing Xie, Changqing Xie, Tianchun Ye, Tianchun Ye, Xinchun Liu, Xinchun Liu, } "The advanced nanofabrication technology", Proc. SPIE 5645, Advanced Microlithography Technologies, (27 January 2005); doi: 10.1117/12.570206; https://doi.org/10.1117/12.570206

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