21 February 2005 Subpicosecond Z-scan measurements of the nonlinear refractive index of dense materials
Author Affiliations +
Abstract
We present the results of Z-scan studies on a new setup in the sub-picosecond regime (central wavelength 800nm) carried out on solid and liquid materials such as pure water and silica. These measurements are made possible thanks to a high sensitivity setting up of our Z-scan method and in-situ characterizations of the spatio-temporal parameters of the beam. Besides, with the use of a newly adapted numerical simulation, only calibration errors of measurement devices are significant. These measurements are then used to separate the different contributions to the nonlinear refractive index from nanosecond scale mechanisms like electrostriction and/or thermal relaxation.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Franck Billard, Franck Billard, Mireille Commandre, Mireille Commandre, Claude Amra, Claude Amra, Jean-Yves Natoli, Jean-Yves Natoli, Hassan Akhouayri, Hassan Akhouayri, } "Subpicosecond Z-scan measurements of the nonlinear refractive index of dense materials", Proc. SPIE 5647, Laser-Induced Damage in Optical Materials: 2004, (21 February 2005); doi: 10.1117/12.585435; https://doi.org/10.1117/12.585435
PROCEEDINGS
8 PAGES


SHARE
Back to Top