3 January 1986 OFDR Diagnostics For Fiber/Integrated Optic Systems And High Resolution Distributed Fiber Optic Sensing
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Abstract
Optical frequency domain reflectometry (OFDR) shows promise as a diagnostic tool for high resolution ranging in fiber optic networks/integrated optic devices, and for high resolution distributed fiber optic sensing. Chirped semiconductor lasers may be employed to obtain submillimeter spatial resolutions. This paper discusses applications, some signal processing aspects of this technology, the potential, and actual performance of some experimental laboratory OFDR systems.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stuart A. Kingsley, Stuart A. Kingsley, D.E . N . Davies, D.E . N . Davies, } "OFDR Diagnostics For Fiber/Integrated Optic Systems And High Resolution Distributed Fiber Optic Sensing", Proc. SPIE 0566, Fiber Optic and Laser Sensors III, (3 January 1986); doi: 10.1117/12.949800; https://doi.org/10.1117/12.949800
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