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17 January 2005 Extension of the ISO 12233 SFR measurement technique to provide MTF bounds for critical imaging arrays
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Proceedings Volume 5668, Image Quality and System Performance II; (2005) https://doi.org/10.1117/12.593081
Event: Electronic Imaging 2005, 2005, San Jose, California, United States
Abstract
The ISO 12233 SFR measurement technique provides a quick and reliable method to evaluate the SFR and, with slight modification, the MTF of digital imaging systems. This work demonstrates that the MTF provided by the technique approaches the theoretical result for a single imaging element once all other factors, such as image forming optics, have been accounted for. Digital imaging is being increasingly accepted as a solution for critical systems as issues regarding security and provenience are being resolved. The evidential need for recording fingerprints is just one example. Jenkin et al. previously showed that a lower bound of array MTF could be derived taking account of the sampling pitch, aperture and phase differences between the signal and imaging elements. This is a pessimistic estimate of array performance and, as such, holds advantages for design of critical systems. This work shows simple extension of the ISO 12233 SFR measurement technique to provide an estimate of the lower bound and compares it to known exposures of a simple Monte-Carlo model and a commercial digital camera.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robin B. Jenkin, Ralph E. Jacobson, Mark A. Richardson, and Ian C. Luckraft "Extension of the ISO 12233 SFR measurement technique to provide MTF bounds for critical imaging arrays", Proc. SPIE 5668, Image Quality and System Performance II, (17 January 2005); https://doi.org/10.1117/12.593081
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