General Electric CID Profile Camera

D. W. Breithaupt

doi:10.1117/12.949871

14 January 1986 General Electric CID Profile Camera

D. W. Breithaupt

Proceedings Volume 0569, High Speed Photography, Videography, and Photonics III; (1986) https://doi.org/10.1117/12.949871
Event: 29th Annual Technical Symposium, 1985, San Diego, United States

Abstract

The General Electric Charge Injection Device (CID) can be configured to obtain X and Y profiles, an image profile defined as the summation of photocharge along a column (X) or row (Y) in the array. X and Y profiles are directly obtainable from a CID imager as the profile read operation takes advantage of unique non-destructive readout capability of the CID sensor. Profiles contain information which can be used to determine centroid, area, or other image features and represent a considerable reduction of data (i.e., a 512 x 512 array contains 262,144 pixels but only 512 X and 512 Y profile data points). Both profiles can be acquired in less than one (1) millisecond from a 512 x 512 array compared to conventional readout times of 30 milliseconds. This capability facilitates high speed videography, measurement and inspection applications.

Citation Download Citation

D. W. Breithaupt "General Electric CID Profile Camera", Proc. SPIE 0569, High Speed Photography, Videography, and Photonics III, (14 January 1986); https://doi.org/10.1117/12.949871

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