HgCdTe Focal Plane Development Concepts

M. N. Gurnee; R. M. Broudy

doi:10.1117/12.950324

11 December 1985 HgCdTe Focal Plane Development Concepts

M. N. Gurnee, R. M. Broudy

Author Affiliations +

Proceedings Volume 0570, Solid-State Imaging Arrays; (1985) https://doi.org/10.1117/12.950324
Event: 29th Annual Technical Symposium, 1985, San Diego, United States

Abstract

As advanced infrared systems are designed and developed, the requirement for greater sensitivity and resolution is continually encountered. System performance parameters relating to these requirements always depend on the signal-to-noise ratio of the total focal plane. Under optimum operating conditions for the best materials, the response is directly proportional to the total area of sensitive material on the focalplane Ap, whereas the noise varies as Ap1/2 thus system sensitivity varies as Ap1/2. However, resolution depends inversely on the dimensions of the sensitive elements. Thus, higher performance systems will require multielement focal planes of small, closely packed detectors.

Citation Download Citation

M. N. Gurnee and R. M. Broudy "HgCdTe Focal Plane Development Concepts", Proc. SPIE 0570, Solid-State Imaging Arrays, (11 December 1985); https://doi.org/10.1117/12.950324

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