Lateral resolution enhancement in confocal self-interference microscopy

DongKyun Kang; DaeGab Gweon

doi:10.1117/12.589526

24 March 2005 Lateral resolution enhancement in confocal self-interference microscopy

DongKyun Kang, DaeGab Gweon

Proceedings Volume 5701, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XII; (2005) https://doi.org/10.1117/12.589526
Event: SPIE BiOS, 2005, San Jose, CA, United States

Abstract

Lateral resolution enhancement in confocal self-interference microscopy (CSIM) is evaluated. CSIM, which uses the birefringence of the calcite plate to generate self-interference pattern, sharpens the central lobe of the effective spot. Numerical simulation results of two-dimensional imaging performances are presented. Two-point resolution of 149nm is achieved, which is enhanced by nearly 100% compared to that of confocal microscopy.

Citation Download Citation

DongKyun Kang and DaeGab Gweon "Lateral resolution enhancement in confocal self-interference microscopy", Proc. SPIE 5701, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XII, (24 March 2005); https://doi.org/10.1117/12.589526

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