27 April 2005 Revitalized militarily critical technologies program
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Abstract
The Department of Defense (DoD) Militarily Critical Technologies Program (MCTP) provides a systematic, ongoing assessment and analysis of goods and technologies to determine those that would permit significant advances in the development, production and use of military capabilities of potential adversaries and those that are being developed worldwide that have the potential to significantly enhance or degrade US military capabilities in the future. The program's objective is to characterize the technologies, including quantitative values and parameters, and assess worldwide technology capabilities. The MCTP is composed of two sets of documents, the well known and often referenced one, the MCTL, and a second one, a more recently added list called the Developing Science and Technologies List (DSTL). Both are products of the MCTP process, however, the later is primarily used by DDR&E and other government organizations and agencies to aid in the prioritization and understanding of new technologies being developed worldwide. Technologies are selected for the MCTL and the DSTL through the deliberation and consensus of Technology Working Groups (TWGs). TWGs continually screen technologies and nominate items to be added or removed from the MCTL and the DSTL as appropriate. Working within an informal structure, TWG members are composed of government, industry and academia subject matter experts, who strive to produce precise and objective analyses across each technology areas. This process and details of the current MCTP are outlined in this poster paper. This paper focuses on the solid state laser technology area, using it as an example of the MCTP's product of assessing, identifying, and quantifying militarily critical technology parameters.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Raymond V. Wick, "Revitalized militarily critical technologies program", Proc. SPIE 5707, Solid State Lasers XIV: Technology and Devices, (27 April 2005); doi: 10.1117/12.611563; https://doi.org/10.1117/12.611563
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