Translator Disclaimer
27 April 2005 Thermally induced stress and strain in YAG/sapphire single-crystal composites
Author Affiliations +
Abstract
The thermally induced stress of the order of 200 MPa and strain of the order of 2 x 10-4 in adhesive free bonded (AFB) YAG/sapphire single crystal composites have been determined as functions of crystallographic orientation by stress birefringence measurements using a polariscope and by surface figure measurements using a phase shift Fizeau interferometer, respectively. The deformation of YAG or sapphire end faces of the composite samples into anticlastic surfaces is likely due to thermally induced relative biaxial strain between the YAG and sapphire components during heat-treatment. We have found that the YAG/sapphire composites stay stress- and strain-free when they are heat-treated below a critical temperature. The thermally induced stress and strain increase exponentially with respect to the heat-treat temperature that is above a critical temperature. The magnitudes of thermally induced stress and strain in the heat-treated composite samples allow an estimate of the thermal stress resistance of YAG/sapphire composites. Wright-Patterson Air Force Research Laboratory has supported this work under Phase II Contract F33615-03-C-5442.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Huai-Chuan Lee, Helmuth Meissner, and Oliver Meissner "Thermally induced stress and strain in YAG/sapphire single-crystal composites", Proc. SPIE 5707, Solid State Lasers XIV: Technology and Devices, (27 April 2005); https://doi.org/10.1117/12.590718
PROCEEDINGS
12 PAGES


SHARE
Advertisement
Advertisement
Back to Top