12 April 2005 Q factors and resonant states of whispering-gallery-mode dielectric microdisk cavities for lasing applications
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Abstract
We study the effect of boundary roughness on the resonant states broadening of the optical whispering-gallery-mode microdisk lasing cavities. We develop a new, computationally effective, and numerically stable approach based on the scattering matrix (S-matrix) technique that is capable to deal with both arbitrary complex geometry and inhomogeneous refraction index inside the two-dimensional cavity. The method presented has been applied to study the effect of surface roughness and inhomogeneity of the refraction index on Q-values of microdisk cavities for lasing applications. We demonstrate that even small surface roughness (Δr⟨ λ/50) can lead to an extreme degradation of high-Q cavity modes by many orders of magnitude. The results of numerical simulation are analyzed and explained in terms of wave reflection at a curved dielectric interface combined with the examination of Poincare surfaces of section as well as Husimi distributions.
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Aliaksandr I. Rahachou, Igor V. Zozoulenko, "Q factors and resonant states of whispering-gallery-mode dielectric microdisk cavities for lasing applications", Proc. SPIE 5708, Laser Resonators and Beam Control VIII, (12 April 2005); doi: 10.1117/12.602030; https://doi.org/10.1117/12.602030
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