23 March 2005 Some effects affecting laser-induced damage of solid dielectrics excited by ultrashort laser pulses
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Non-ablative mechanism of femtosecond laser drilling of bulk dielectrics is proposed which is assuming concentrating and condensation of laser-generated vacancies into a void in a center of a laser waist at presence of picosecond photo-excited dense electron-hole plasma. Picosecond diffusive transport of neutral and/or charged vacancies and interstitials in the laser waist is driven by an inhomogeneous transient stress induced in the region via interactions of the dense electron-hole plasma and point defects with center-zone acoustic phonons. Simultaneously, inhomogeneous bandgap renormalization due to a coherent interaction of the plasma with center-zone optical phonons may contribute to the diffusive transport of charged point defects. This mechanism allows estimates of electron-hole plasma densities required for the "mild" micro-void fabrication regime, kinetics of void growth and their characteristic sizes as well as characteristic dimensions of surrounding laser-affected zones, consistent with known experimental results.
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Sergey I. Kudryashov, "Some effects affecting laser-induced damage of solid dielectrics excited by ultrashort laser pulses", Proc. SPIE 5710, Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications IV, (23 March 2005); doi: 10.1117/12.586067; https://doi.org/10.1117/12.586067


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