Paper
21 March 2005 Ultra-high resolution optical coherence tomography for material characterization and quality control
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Abstract
Optical coherence tomography (OCT), so far mainly used in the biomedical field, has a high potential as non-destructive and contactless technique for material characterization and analysis. For these applications, OCT systems with ultra-high resolution in the micrometer range and capable of high imaging speeds are required. In this work, we combine ultra-high resolution imaging using a femtosecond Ti:sapphire laser as light source with the concepts of transversal OCT. Based on acquisition by heterodyne detection via acousto-optic modulators (AOMs), and by using an xy-galvano scanner unit we are able to obtain en-face scans with sizes as large as 3 x 3 mm2 within a few seconds. The ultra-high resolution of our OCT system of 2.95 μm axially and 4 μm laterally, both in air, is shown to be essential for imaging of different compounds and fibre materials. We demonstrate the benefits of en-face scanning OCT for various applications in material investigation where in-plane information is of interest which can hardly be obtained by cross-sectional OCT.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Karin Wiesauer, Michael Pircher, Erich Goetzinger, Rainer Engelke, Gisela Ahrens, Gabi Gruetzner, Christoph K. Hitzenberger, and David Stifter "Ultra-high resolution optical coherence tomography for material characterization and quality control", Proc. SPIE 5714, Commercial and Biomedical Applications of Ultrafast Lasers V, (21 March 2005); https://doi.org/10.1117/12.593612
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Cited by 3 scholarly publications.
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KEYWORDS
Optical coherence tomography

Bragg cells

Image resolution

Material characterization

Light sources

Imaging systems

Mirrors

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