Carrier and photon analyses of photonic crystal microlasers

Kengo Nozaki; Toshihiko Baba

doi:10.1117/12.601952

28 April 2005 Carrier and photon analyses of photonic crystal microlasers

Kengo Nozaki, Toshihiko Baba

Proceedings Volume 5722, Physics and Simulation of Optoelectronic Devices XIII; (2005) https://doi.org/10.1117/12.601952
Event: Integrated Optoelectronic Devices 2005, 2005, San Jose, California, United States

Abstract

In photonic crystal (PC) microlasers with point defect cavities, effective carriers are reduced by the leakage to outside of the defect, surface recombination, spatial carrier hole burning, and Auger recombination. To estimate these effects, we calculated carrier and photon behavior by solving two-dimensional rate equations in space and time domains. The result clearly shows these effects and their dependence on cavity structure, pump area, and so on. Compared with that for the microdisk laser, higher threshold values are estimated for PC microlasers. However, a comparably low threshold density and a high efficiency are expected for the quasiperiodic PC microlaser, because the hole burning by the whispering gallery mode of this cavity suppresses the carrier leakage.

Citation Download Citation

Kengo Nozaki and Toshihiko Baba "Carrier and photon analyses of photonic crystal microlasers", Proc. SPIE 5722, Physics and Simulation of Optoelectronic Devices XIII, (28 April 2005); https://doi.org/10.1117/12.601952

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