Ultra low noise photodetectors with internal discrete amplification

Krishna Rao Linga; Edward E. Godik; Wayne A. Seemungal; D. Shushakov; Vitaly E. Shubin

doi:10.1117/12.591746

7 April 2005 Ultra low noise photodetectors with internal discrete amplification

Krishna Rao Linga, Edward E. Godik, Wayne A. Seemungal, D. Shushakov, Vitaly E. Shubin

Proceedings Volume 5726, Semiconductor Photodetectors II; (2005) https://doi.org/10.1117/12.591746
Event: Integrated Optoelectronic Devices 2005, 2005, San Jose, California, United States

Abstract

We have designed and developed a new family of photodetectors with Internal Discrete Amplification (IDA) mechanism. These photodetectors can operate in linear (analog) detection mode with gain-bandwidth product up to 5^.10¹⁴ and few-photon sensitivity as well as in the photon counting mode with count rates up to 10⁸ cps. Some of their key performance characteristics exceed those of photomultiplier tube (PMT) and avalanche photodiode (APD) devices. The measured parameters of the detectors are gain > 10⁵, excess noise factor as low as 1.02, maximum count rate > 10⁸ counts/s, and rise/fall time < 300 ps.

Citation Download Citation

Krishna Rao Linga, Edward E. Godik, Wayne A. Seemungal, D. Shushakov, and Vitaly E. Shubin "Ultra low noise photodetectors with internal discrete amplification", Proc. SPIE 5726, Semiconductor Photodetectors II, (7 April 2005); https://doi.org/10.1117/12.591746

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