Extension Of The Phase/Doppler Particle Analyzer To Submicron Particle Measurements

M. J. Houser; W. D. Bachalo

doi:10.1117/12.978036

11 November 1985 Extension Of The Phase/Doppler Particle Analyzer To Submicron Particle Measurements

M. J. Houser, W. D. Bachalo

Proceedings Volume 0573, Particle Sizing and Spray Analysis; (1985) https://doi.org/10.1117/12.978036
Event: 29th Annual Technical Symposium, 1985, San Diego, United States

Abstract

The Phase/Doppler method which has proven to be successful in obtaining large particle size and velocity measurements in realistic environments has been extended to measure particles as small as 0.5 micrometer in diameter. Mie theory calculations served to determine the feasibility of obtaining adequate size resolution. Experiments were conducted using 0.54, 0.80, 0.94, 2.0, and 2.88 micrometer polystyrene latex spheres to verify the measurement capability. Although the measured distributions were relatively broad, the modes of the distributions were in good agreement with the specified size. Polydispersions with mean sizes on the order of 1 to 5 micrometers were measured and compared to measurements by other means. These results also were in good agreement.

Citation Download Citation

M. J. Houser and W. D. Bachalo "Extension Of The Phase/Doppler Particle Analyzer To Submicron Particle Measurements", Proc. SPIE 0573, Particle Sizing and Spray Analysis, (11 November 1985); https://doi.org/10.1117/12.978036

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