Simulations of boundary layers and defective sites in coupled VCSEL arrays

Spilios Riyopoulos

doi:10.1117/12.588771

14 March 2005 Simulations of boundary layers and defective sites in coupled VCSEL arrays

Spilios Riyopoulos

Proceedings Volume 5737, Vertical-Cavity Surface-Emitting Lasers IX; (2005) https://doi.org/10.1117/12.588771
Event: Integrated Optoelectronic Devices 2005, 2005, San Jose, California, United States

Abstract

This work addresses the effects of finite boundaries in coupled arrays as well as those from "defects" from individual bias failures, of interest for practical applications. Analysis and numerical simulations based on the tight-binding approximation show that phase-locking persists in finite arrays. Self-regulation of the edge cavity density and power generate boundary layers of differentiated cavity operation values. The inter-cavity phase shift remains nearly uniform, with a small superimposed linear slope caused by cross-cavity reflection interference from DBRs. Phase locking is robust against partial or complete failure to lase for individual cavity sites, or even entire rows, due to biasing errors. The inherent gain dependence on carrier depletion and on the lateral cavity interactions is shown to be important.

Citation Download Citation

Spilios Riyopoulos "Simulations of boundary layers and defective sites in coupled VCSEL arrays", Proc. SPIE 5737, Vertical-Cavity Surface-Emitting Lasers IX, (14 March 2005); https://doi.org/10.1117/12.588771

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