4 May 2005 Topography impacts on line-width control for gate level lithography
Author Affiliations +
Abstract
The dimensional variations caused by topography differences between active and non active shallow trench isolation (STI) areas, at the gate level, need to be controlled through proper use of reflectivity control methods. Line-width variation caused by topography can either be a disastrous problem or so small that it is hard to detect. Some of the primary variables include the step-height, active-area-width and planarization length of the BARC being used. In order to experimentally compare different reflectivity control methods, wafers were built with steps ranging from 7.5 nm higher to 27 nm lower than the surroundings. Organic BARC thicknesses of 90 and 130 nm were evaluated. Two resist thicknesses were also evaluated. Along with examining the effect of step-height, we also examined the effect of active-area-widths ranging from 0.5 um to 4.5 um. The data demonstrate that line-width variation going over this variety of steps is well under 1 nm when BARC and resist thicknesses are optimized.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Allen H. Gabor, Allen H. Gabor, Scott D. Halle, Scott D. Halle, Chidam Kallingal, Chidam Kallingal, } "Topography impacts on line-width control for gate level lithography", Proc. SPIE 5753, Advances in Resist Technology and Processing XXII, (4 May 2005); doi: 10.1117/12.600697; https://doi.org/10.1117/12.600697
PROCEEDINGS
9 PAGES


SHARE
Back to Top