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Post-CMOS chip-level processing for high-aspect-ratio microprobe fabrication utilizing pulse plating
Fabrication of three-dimensional structures by micro stereolithography for electromagnetic absorber applications
Bandgaps of zigzag finite-length nanotubes ab initio calculations: ground state degeneracy and single-electron spectra
Determination of compressive residual stress in a doubly clamped microbeam according to its buckled shape