Electron/Ion/Photon Techniques for Characterization of Nanoscale and Microscale Materials and Structures
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X-ray refraction topography and computed tomography for NDE of lightweight materials (Keynote Paper)
Nondestructive characterization of nanoparticles in solids by Raman spectroscopy and small angle x-ray scattering
Self-regulating charge control for ultra high resolution scanning electron microscopy (Invited Paper)
Elastic modulus of nanomaterials: resonant contact-AFM measurement and reduced-size effects (Invited Paper)
Numerical time-domain simulation of wave propagation and scattering in acoustic microscopy for subsurface defect characterization
Integrated cantilever fabrication and system development for ultrasonic and acoustic scanning probe microscopy