9 May 2005 Nondestructive characterization of nanoparticles in solids by Raman spectroscopy and small angle x-ray scattering
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Abstract
Laser spectroscopical methods as Raman scattering (RS) and Photoluminescence as well as Small Angle Scattering of Xrays (SAXS) are presented as powerful tools for the efficient, nondestructive and contact-less characterization of nanoparticles of low concentration (< 1% in volume) in solids in dependence on the history of thermal treatment. The complementary determination of size distribution of CdSxSe1-x nanocrystallites in silicate glass filters and of arsenic precipitates in low-temperature grown GaAs layers by RS and SAXS is exemplarily presented.
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M. Herms, G. Irmer, P. Verma, G. Goerigk, "Nondestructive characterization of nanoparticles in solids by Raman spectroscopy and small angle x-ray scattering", Proc. SPIE 5766, Testing, Reliability, and Application of Micro- and Nano-Material Systems III, (9 May 2005); doi: 10.1117/12.602064; https://doi.org/10.1117/12.602064
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