8 December 2004 Ballistic emission spectroscopy and imaging of a buried metal-organic interface
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Proceedings Volume 5774, Fifth International Conference on Thin Film Physics and Applications; (2004) https://doi.org/10.1117/12.607273
Event: Fifth International Conference on Thin Film Physics and Applications, 2004, Shanghai, China
Abstract
Metal organic interfaces have been under intensive scientific investigation over the past few years with the objective of improving devices based on organic materials. In this study, we report the first results on spectroscopy and imaging of a buried metal-organic interface using ballistic electron emission microscopy (BEEM). Unlike photoexcitation-based experiments, which typically average over large interfacial areas, BEEM enables direct observation of local interface band structure with nanometer resolution. The interface of silver (Ag) - polyparaphenylene (PPP, a blue emitter with high photoluminescence efficiency) is investigated. Multiple injection barriers and spatial non-uniformity of carrier injection are observed. Possible causes for these features will be discussed. The BEEM current images are found to correlate marginally with the surface topography of the silver film.
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N. Chandrasekhar, N. Chandrasekhar, Cedric Troadec, Cedric Troadec, Linda Kunardi, Linda Kunardi, } "Ballistic emission spectroscopy and imaging of a buried metal-organic interface", Proc. SPIE 5774, Fifth International Conference on Thin Film Physics and Applications, (8 December 2004); doi: 10.1117/12.607273; https://doi.org/10.1117/12.607273
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