8 December 2004 Characterization of vacuum-evaporated In70Se30 thin films
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Proceedings Volume 5774, Fifth International Conference on Thin Film Physics and Applications; (2004) https://doi.org/10.1117/12.607327
Event: Fifth International Conference on Thin Film Physics and Applications, 2004, Shanghai, China
Abstract
This paper discusses the properties of thermally evaporated polycrystalline In70Se30 thin films (Tsb=303-473K). Structural and surface morphology of the film were identified by X-ray diffractogram and Scanning Electron Microscopy. The composition was verified by EDAX and XPS spectrum. The results of conductivity measurements (Tsb =303K) have revealed that thermionic emission and variable range hopping (VRH) are the two dominant conduction mechanisms in the temperature ranges of (230-280 K) and (170-220 K) respectively.
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C. Viswanathan, S. Gopal, B. Karunagaran, Devanesan Mangalaraj, Sa. K. Narayandass, J. Yi, "Characterization of vacuum-evaporated In70Se30 thin films", Proc. SPIE 5774, Fifth International Conference on Thin Film Physics and Applications, (8 December 2004); doi: 10.1117/12.607327; https://doi.org/10.1117/12.607327
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