8 December 2004 Microstructure and properties of sol-gel-derived (La,Sr)CoO3 thin film with compositional fluctuation La/Sr ratio
Author Affiliations +
Proceedings Volume 5774, Fifth International Conference on Thin Film Physics and Applications; (2004) https://doi.org/10.1117/12.607621
Event: Fifth International Conference on Thin Film Physics and Applications, 2004, Shanghai, China
Abstract
Thin films of Lanthanum strontium cobalite [(La1-xSrx)CoO3, LSCO] were directly spin-coated onto SiO2/Si (1 0 0) substrates with compositional fluctuation La/Sr ratio, followed by rapid thermal annealing (RTA). The effects of different La/Sr ratios on the microstructure, surface morphology and electrical properties of the films were examined by X-ray diffraction (XRD), scanning electrical microscopy (SEM) and four probe measurements, respectively. The results indicate that the thin film displays a structure transform from rhombohedral phase to cubic phase around x=0.5, and that the resistivity of the thin film decreases with the increase of La/Sr ratio at the first, then increase slightly. A minimum value of resistivity of LSCO appears at x=0.5. In addition, the effect of the annealing temperature on the electrical properties of La0.5Sr0.5CoO3 films is discussed.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wei Lu, Ping Zheng, Zhongyan Meng, Wenbiao Wu, "Microstructure and properties of sol-gel-derived (La,Sr)CoO3 thin film with compositional fluctuation La/Sr ratio", Proc. SPIE 5774, Fifth International Conference on Thin Film Physics and Applications, (8 December 2004); doi: 10.1117/12.607621; https://doi.org/10.1117/12.607621
PROCEEDINGS
4 PAGES


SHARE
RELATED CONTENT

Influence of oxygen on the quality of the PZT thin...
Proceedings of SPIE (November 11 2016)
Characterization of sol gel prepared Ti02 thin film for O2...
Proceedings of SPIE (November 14 1997)
BaTiO3 thin films fabricated by sol-gel process
Proceedings of SPIE (October 23 2002)
Red luminescence from Si quantum dots embedded in SiOx films...
Proceedings of SPIE (September 14 2005)
Growth of highly c axis oriented SBN thin films on...
Proceedings of SPIE (January 17 2005)

Back to Top