The LIDT of Ta2O5/SiO2 narrow-band interference filters under different laser modes

WeiDong Gao; Hongbo He; Yuanan Zhao; Jianda Shao; Zhengxiu Fan

doi:10.1117/12.608692

8 December 2004 The LIDT of Ta₂O₅/SiO₂ narrow-band interference filters under different laser modes

WeiDong Gao, Hongbo He, Yuanan Zhao, Jianda Shao, Zhengxiu Fan

Proceedings Volume 5774, Fifth International Conference on Thin Film Physics and Applications; (2004) https://doi.org/10.1117/12.608692
Event: Fifth International Conference on Thin Film Physics and Applications, 2004, Shanghai, China

Abstract

The Laser-induced damage behavior of narrow-band interference filters was investigated with a Nd:YAG laser at 1064nm under single-pulse mode and free-running mode. The absorption measurement of such coatings had been performed by Surface Thermal Lensing (STL) technique. And the relationship between damage morphology and absorption under the two different laser modes had also been studied in detail. The explanation is given by the standing-wave distribution theory.

Citation Download Citation

WeiDong Gao, Hongbo He, Yuanan Zhao, Jianda Shao, and Zhengxiu Fan "The LIDT of Ta₂O₅/SiO₂ narrow-band interference filters under different laser modes", Proc. SPIE 5774, Fifth International Conference on Thin Film Physics and Applications, (8 December 2004); https://doi.org/10.1117/12.608692

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