14 February 2005 Multispectral phase-crossing white-light interferometry
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Proceedings Volume 5776, Eighth International Symposium on Laser Metrology; (2005) https://doi.org/10.1117/12.611644
Event: Eighth International Conference on Laser Metrology, 2005, Merida, Mexico
Abstract
A new method of white-light fringes analysis called multi-spectral phase-crossing detection is presented. The technique is based on analysis of phase distributions of at least two white-light interferograms recorded simultaneously by detectors with mutually different spectral sensitivities. The analysis of the phase crossing of multiple white-light interferograms with different spectral bands gives us the possibility to find the position of zero optical path difference without ambiguity. The theoretical background and measurement results are presented.
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Michal Emanuel Pawlowski, Michal Emanuel Pawlowski, Youhei Sakano, Youhei Sakano, Yoko Miyamoto, Yoko Miyamoto, Mitsuo Takeda, Mitsuo Takeda, } "Multispectral phase-crossing white-light interferometry", Proc. SPIE 5776, Eighth International Symposium on Laser Metrology, (14 February 2005); doi: 10.1117/12.611644; https://doi.org/10.1117/12.611644
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