14 February 2005 Phase demodulation of interferograms with open or closed fringes
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Proceedings Volume 5776, Eighth International Symposium on Laser Metrology; (2005) https://doi.org/10.1117/12.611670
Event: Eighth International Conference on Laser Metrology, 2005, Merida, Mexico
Abstract
Analysis of fringe patterns with partial-field and/or closed fringes is still a challenging problem that requires the development of robust methods. This paper presents a method for fringe pattern analysis with those characteristics. The method is initially introduced as a phase refinement process for computed coarse phases, as those obtained from partial-field patterns with a full-field method for open fringes analysis. Based on the phase refinement method, it is proposed a propagative scheme for phase retrieval from closed-fringe interferograms.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mariano Rivera, Mariano Rivera, "Phase demodulation of interferograms with open or closed fringes", Proc. SPIE 5776, Eighth International Symposium on Laser Metrology, (14 February 2005); doi: 10.1117/12.611670; https://doi.org/10.1117/12.611670
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