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2 June 2005 Nanoscale characterisation by SANS and residual stresses determination by neutron diffraction related to materials and components of technological interest
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Abstract
Neutron techniques, among the other non-destructive diagnostics, are becoming more and more relevant in investigating materials and components of industrial interest. In this paper, Small Angle Neutron Scattering (SANS) for microstructural characterisation-especially related to the nanoscale-and Neutron Diffraction for Residual Stresses (RS) measurements are considered. The basic theoretical aspects and some industrial applications of each technique are described. In particular, RS determination in welding, in extruded specimens and in components for energy industry is reported. SANS measurements concerning materials and components for energy and automotive industry are finally presented.
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Massimo Rogante and Laszlo Rosta "Nanoscale characterisation by SANS and residual stresses determination by neutron diffraction related to materials and components of technological interest", Proc. SPIE 5824, Opto-Ireland 2005: Nanotechnology and Nanophotonics, (2 June 2005); https://doi.org/10.1117/12.606090
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