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3 June 2005 All-optical sampling based on two-photon absorption in a semiconductor microcavity for high-speed OTDM
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Abstract
Future high-speed optical communications networks operating at data rates in excess of 100Gbit/s per channel will require a sensitive and ultrafast technique for precise optical signal monitoring. The standard way of characterising high-speed optical signals to use a fast photodetector in conjunction with a high-speed oscilloscope. However, this method is limited to a maximum data rate of approximately 40Gbit/s. An alternative is to employ all-optical sampling techniques based on ultrafast optical nonlinearities present in optical fibres, optical crystals and semiconductors. One such nonlinearity is the optical-to-electrical process of Two-Photon Absorption (TPA) in a semiconductor. This paper presents an optical sampling technique based on TPA in a specially designed semiconductor microcavity. By incorporating the microcavity design, we are able to enhance the TPA efficiency to a level that can be used for high-speed optical sampling.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
P. J. Maguire, L. P. Barry, T. Krug, M. Lynch, A. L. Bradley, J. F. Donegan, and H. Folliot "All-optical sampling based on two-photon absorption in a semiconductor microcavity for high-speed OTDM", Proc. SPIE 5825, Opto-Ireland 2005: Optoelectronics, Photonic Devices, and Optical Networks, (3 June 2005); https://doi.org/10.1117/12.604835
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