22 April 2005 Laser measurements of optical plastics
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Proceedings Volume 5830, 13th International School on Quantum Electronics: Laser Physics and Applications; (2005); doi: 10.1117/12.618717
Event: 13th International School on Quantum Electronics: Laser Physics and Applications, 2004, Bourgas, Bulgaria
Abstract
A He-Ne laser device has been used for refractometric measuring of a number of optical plastic (OP) specimens. We applied an ellipsometric laser system for the index of refraction initial determination. A table of the experimentally obtained refractive indices of various types of the principal and some new developmental OPs at the laser wavelength λ=632.8 nm is illustrated. The dispersion coefficients of ten American, Japanese and German OP samples were computed using a modified Cauchy's dispersive equation. A table of OP's refractive indices calculated at twenty laser wavelengths in the spectral area from 405 nm (GaN LD) to 1064 nm (YAG devices) is presented.
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Ivan D. Nikolov, Nina G. Sultanova, Stefka N. Kasarova, "Laser measurements of optical plastics", Proc. SPIE 5830, 13th International School on Quantum Electronics: Laser Physics and Applications, (22 April 2005); doi: 10.1117/12.618717; https://doi.org/10.1117/12.618717
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KEYWORDS
Refractive index

Prisms

Laser optics

Helium neon lasers

Polymethylmethacrylate

Near infrared

Refraction

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