29 April 2005 Debye-Scherrer simulation and its use for nano-materials testing
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Proceedings Volume 5831, Eighth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering; (2005) https://doi.org/10.1117/12.619496
Event: Eighth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, 2004, St. Petersburg, Russian Federation
Abstract
Nano-material specimens of metallic glass were tested with the Debye-Scherrer x-ray diffraction method. For data simulation and data treatment new Debye-Scherrer simulator was devised. The simulator and test results are discussed.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexander Eu. Kalabushkin, "Debye-Scherrer simulation and its use for nano-materials testing", Proc. SPIE 5831, Eighth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (29 April 2005); doi: 10.1117/12.619496; https://doi.org/10.1117/12.619496
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