7 June 2005 Optical filters on the basis of α-Ag2Te thin films
Author Affiliations +
Proceedings Volume 5834, 18th International Conference on Photoelectronics and Night Vision Devices; (2005) https://doi.org/10.1117/12.629020
Event: 18th International Conference on Photoelectronics and Night Vision Devices and Quantum Informatics 2004, 2004, Moscow, Russian Federation
Abstract
The investigation of α-Ag2Te thin films optical properties by reflection and transmission spectra in IR-range are carried out. In absorption spectra there is an area (0.08÷0.056 eV) of free carriers absorption with the sharp increasing of the absorption constant. The fine structure of absorption with peak at 0.09 eV and half-width 0.0075 eV connected with absorption of impurity transition by a valence band-small-sized donor is found. For the first time at room temperature in experimental reflection spectrum R (λ) of α-Ag2Te behind a plasma minimum (1050 cm-1) are detected two further minimum (760cm-1 and 500 cm-1) stipulated by interaction of plasmons and long-wave longitudinal optical phonons. In the proper absorption region α (λ) spectrum presents the narrow sharp peak with half-width 0.03eV and steep slope to the short-wave. The indicated features of α-Ag2Te thin films optical spectrums allow considering this films as a perspective material for IR optical filters manufacturing.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sh. M. Alekperova, Sh. M. Alekperova, A. A. Aliyev, A. A. Aliyev, Kh. D. Jalilova, Kh. D. Jalilova, I. A. Ahmedov, I. A. Ahmedov, } "Optical filters on the basis of α-Ag2Te thin films", Proc. SPIE 5834, 18th International Conference on Photoelectronics and Night Vision Devices, (7 June 2005); doi: 10.1117/12.629020; https://doi.org/10.1117/12.629020
PROCEEDINGS
4 PAGES


SHARE
Back to Top