Voltage to frequency converter for DAC test

John Hogan; Ronan Farrell

doi:10.1117/12.608479

30 June 2005 Voltage to frequency converter for DAC test

John Hogan, Ronan Farrell

Proceedings Volume 5837, VLSI Circuits and Systems II; (2005) https://doi.org/10.1117/12.608479
Event: Microtechnologies for the New Millennium 2005, 2005, Sevilla, Spain

Abstract

In this paper a modified relaxation oscillator is proposed as the core of an analog to digital modulator for on chip signal extraction for test. The architecture uses digital current source generation and digital switching in place of active circuitry. The resulting design allows for high input sensitivity, robustness to component variation while occupying little silicon area. This paper provides solutions on the main challenges in implementing this modulator and how it may be integrated with a digital based tester.

Citation Download Citation

John Hogan and Ronan Farrell "Voltage to frequency converter for DAC test", Proc. SPIE 5837, VLSI Circuits and Systems II, (30 June 2005); https://doi.org/10.1117/12.608479

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