Mode Field Diameter -- Measurement in Far Field Pattern Method and Characteristics --

Toru Myogadani; Shigeru Tanaka

doi:10.1117/12.951005

15 April 1986 Mode Field Diameter -- Measurement in Far Field Pattern Method and Characteristics --

Toru Myogadani, Shigeru Tanaka

Proceedings Volume 0584, Optical Fiber Characteristics and Standards; (1986) https://doi.org/10.1117/12.951005
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France

Abstract

Measurement accuracy of mode field diameter (M.F.D.) by far field pattern method and the characteristics of M.F.D. in viewpoint of its definition are examined. It is found that M.F.D. by second moment definition becomes larger than that by gaussian fit defini-tion with a decrease in normalized frequency V.

Citation Download Citation

Toru Myogadani and Shigeru Tanaka "Mode Field Diameter -- Measurement in Far Field Pattern Method and Characteristics --", Proc. SPIE 0584, Optical Fiber Characteristics and Standards, (15 April 1986); https://doi.org/10.1117/12.951005

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