Thickness dependence of negative refraction in photonic crystals

Vito Mocella

doi:10.1117/12.608977

7 July 2005 Thickness dependence of negative refraction in photonic crystals

Vito Mocella

Proceedings Volume 5840, Photonic Materials, Devices, and Applications; (2005) https://doi.org/10.1117/12.608977
Event: Microtechnologies for the New Millennium 2005, 2005, Sevilla, Spain

Abstract

The beam at the exit surface of a Photonic Crystal (PhC) slab can be periodically modulated, in positive or in negative direction, changing the slab thickness. The thickness in negative refraction on PhC's is not always appropriately considered, in spite of an always increasing literature in this subject. This effect is well known in x-ray diffraction, in the most comprehensive version: the Dynamical Diffraction Theory (DDT). Thickness dependence is a direct result of the so-called Pendellosung phenomenon and is linked to a periodic exchange, inside the crystal, of the energy among direct beam (or positively refracted) and diffracted beam (or negatively refracted). It represents an outstanding example of the application of the result of DDT as a tool for the analysis of s electromagnetic interaction in PhC's.

Citation Download Citation

Vito Mocella "Thickness dependence of negative refraction in photonic crystals", Proc. SPIE 5840, Photonic Materials, Devices, and Applications, (7 July 2005); https://doi.org/10.1117/12.608977

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