23 May 2005 Noise limitation in nano-scale imaging
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Proceedings Volume 5842, Fluctuations and Noise in Photonics and Quantum Optics III; (2005) https://doi.org/10.1117/12.610986
Event: SPIE Third International Symposium on Fluctuations and Noise, 2005, Austin, Texas, United States
When imaging schemes such as Magnetic Resonance Imaging are applied to nano-scale samples, the practical resolution is often limited by noise due to the difficulty of detecting a signal from a small number of nuclear or electronic spins. In this paper we discuss the potential for improving resolution by using optically detected magnetic resonance imaging such as optical Raman excited ESR transitions. Comparisons will be made between magnetic field gradients vs ac Stark gradients and optical Raman vs. direct microwave spin excitations. To make the analysis more concrete we will use nitrogen-vacancy (NV) defect centers in diamond as a test system.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mughees Khan, Mughees Khan, P. R. Hemmer, P. R. Hemmer, } "Noise limitation in nano-scale imaging", Proc. SPIE 5842, Fluctuations and Noise in Photonics and Quantum Optics III, (23 May 2005); doi: 10.1117/12.610986; https://doi.org/10.1117/12.610986

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