Anomalous low-frequency noise behavior in 210 GHz SiGe HBTs

Zhenrong Jin; Jarle A. Johansen; John D. Cressler; Alvin J. Joseph

doi:10.1117/12.609300

23 May 2005 Anomalous low-frequency noise behavior in 210 GHz SiGe HBTs

Zhenrong Jin, Jarle A. Johansen, John D. Cressler, Alvin J. Joseph

Proceedings Volume 5844, Noise in Devices and Circuits III; (2005) https://doi.org/10.1117/12.609300
Event: SPIE Third International Symposium on Fluctuations and Noise, 2005, Austin, Texas, United States

Abstract

We present a comprehensive study of low-frequency noise mechanisms in 210 GHz SiGe HBTs using a variety of measurement techniques, and explain a unique scaling effect. The implication of these noise mechanisms on SiGe HBT compact modeling methodologies are also discussed.

Citation Download Citation

Zhenrong Jin, Jarle A. Johansen, John D. Cressler, and Alvin J. Joseph "Anomalous low-frequency noise behavior in 210 GHz SiGe HBTs", Proc. SPIE 5844, Noise in Devices and Circuits III, (23 May 2005); https://doi.org/10.1117/12.609300

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