23 May 2005 Temporal signal-to-noise ratio of a CMOS buried double junction image sensor
Author Affiliations +
Proceedings Volume 5846, Noise and Information in Nanoelectronics, Sensors, and Standards III; (2005) https://doi.org/10.1117/12.608800
Event: SPIE Third International Symposium on Fluctuations and Noise, 2005, Austin, Texas, United States
Abstract
This paper presents an accurate temporal noise analysis of a new kind of CMOS image sensor for colour design. Operating in the charge storage mode, the noise of this APS is described with a time-varying model. During the reset phase, as the steady state is fast established, classical frequency-domain noise analysis can still be used to determine noise at both sensing nodes. Good agreement is observed between the results obtained by simulation with Cadence CAD tools of a 0.35μm-CMOS test structure and the behaviour predicted by the proposed analytical approach. During the integration phase, as both junctions are floating, the stationary state condition is never fulfilled and the noise analysis must be carried out in the time-domain. Our contribution consists in taking into account the non-linearity of the junction capacitance, which yields more realistic results. Considering only the dominant white noise component, it clearly appears that the junction non-linearity improves the output SNR for both sense nodes at high illumination and/or high integration period.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. Feruglio, V. Fouad Hanna, G. Alquie, G. Vasilescu, "Temporal signal-to-noise ratio of a CMOS buried double junction image sensor", Proc. SPIE 5846, Noise and Information in Nanoelectronics, Sensors, and Standards III, (23 May 2005); doi: 10.1117/12.608800; https://doi.org/10.1117/12.608800
PROCEEDINGS
12 PAGES


SHARE
RELATED CONTENT

A 4MP high-dynamic-range, low-noise CMOS image sensor
Proceedings of SPIE (March 13 2015)
Quanta image sensor: concepts and progress
Proceedings of SPIE (May 05 2016)
Information measures for object recognition
Proceedings of SPIE (September 15 1998)
High-sensitivity high-dynamic digital CMOS imager
Proceedings of SPIE (May 15 2001)
An ultra wide dynamic range CMOS image sensor with a...
Proceedings of SPIE (February 06 2006)

Back to Top