8 June 2005 Application of numerical methods at research of heterogeneous x-rays influence for diffraction line width
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Proceedings Volume 5851, Fundamental Problems of Optoelectronics and Microelectronics II; (2005); doi: 10.1117/12.634055
Event: Fundamental Problems of Optoelectronics and Microelectronics II, 2004, Khabrovsk, Russian Federation
Abstract
Numerical methods have been applied for the estimation of a hardware error of x-ray methods caused heterogeeous characteristic x-rays. It is received, that this error depends on a corner of reflection, number of planes of reflection and wavelength. Dependences of diffraction line broadening owing to nonmonochromaticity from these parameters are resulted.
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V. V. Korchevskii, S. I. Klepikov, L. M. Popova, "Application of numerical methods at research of heterogeneous x-rays influence for diffraction line width", Proc. SPIE 5851, Fundamental Problems of Optoelectronics and Microelectronics II, (8 June 2005); doi: 10.1117/12.634055; https://doi.org/10.1117/12.634055
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KEYWORDS
X-rays

X-ray diffraction

Diffraction

Numerical analysis

Error analysis

Crystals

Convolution

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