Translator Disclaimer
8 June 2005 Iron-silicon interface formation and properties by data of DRS, SMOKE, and AFM measurements
Author Affiliations +
Proceedings Volume 5851, Fundamental Problems of Optoelectronics and Microelectronics II; (2005) https://doi.org/10.1117/12.634545
Event: Fundamental Problems of Optoelectronics and Microelectronics II, 2004, Khabrovsk, Russian Federation
Abstract
The method of Differential Reflection Spectroscopy (DRS) have been applied to study thin iron films during the process of growth on Si (111) or Si(100) surfaces at room temperature. Some details on the Dynamic Standard method in DRS method are presented. Magnetic properties of as-grown films have been demonstrated by the SMOKE method. Dependence ofdielectric functions of the films on the deposit amount is given.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. A. Dotsenko, N. G. Galkin, A. S. Gouralnik, L. A. Koval, and T. V. Turchin "Iron-silicon interface formation and properties by data of DRS, SMOKE, and AFM measurements", Proc. SPIE 5851, Fundamental Problems of Optoelectronics and Microelectronics II, (8 June 2005); https://doi.org/10.1117/12.634545
PROCEEDINGS
7 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT

Growth of iron films on silicon effect of the...
Proceedings of SPIE (November 12 2007)
Thin films of NdFeB deposited by PLD technique
Proceedings of SPIE (April 24 2007)
Universality and scaling in the Barkhausen noise
Proceedings of SPIE (May 08 2003)
Electrical spin injection in p type Si using Fe MgO...
Proceedings of SPIE (October 08 2012)

Back to Top