8 June 2005 New generation holographic measurement system for industrial nondestructive testing
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Proceedings Volume 5851, Fundamental Problems of Optoelectronics and Microelectronics II; (2005) https://doi.org/10.1117/12.633907
Event: Fundamental Problems of Optoelectronics and Microelectronics II, 2004, Khabrovsk, Russian Federation
Abstract
Advanced achievements in holographic and speckle interferometry, physics of solid-state lasers, digital recording and image processing have created real precondistions for a rising of holographic methods of diagnostics to qualitatively new level. In the present work the general concept of universal holographic system for nondestructive researches in industrial environment is considered and results of tests of some units of this equipment are presented.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
V. S. Gurevich, V. S. Gurevich, M. E. Gusev, M. E. Gusev, V. I. Redkorechev, V. I. Redkorechev, V. E. Gaponov, V. E. Gaponov, I. V. Alexeseenko, I. V. Alexeseenko, A. M. Isaev, A. M. Isaev, A. N. Malov, A. N. Malov, Yu. N. Zaharov, Yu. N. Zaharov, } "New generation holographic measurement system for industrial nondestructive testing", Proc. SPIE 5851, Fundamental Problems of Optoelectronics and Microelectronics II, (8 June 2005); doi: 10.1117/12.633907; https://doi.org/10.1117/12.633907
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