12 April 2005 A novel phase measurement profilometry based on linear CCD array
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Proceedings Volume 5852, Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics; (2005) https://doi.org/10.1117/12.621463
Event: Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics, 2004, -, Singapore
Abstract
A new fast 3D profilometry is presented in this paper. Although the phase measuring method can reach more high precision , its real measurement speed is very low and can't be applied on production lines because of its phase-shift operations. Three lines CCD arrays, 1024 pixels each, are mounted together with the same distance intervals. Needless to perform phase shift operations, the CCD can consecutively scan and grab 3 phase distributed pictures which will be separately calculated by 3 DSP processors. Thus the whole measurement process is finished. The experimental results show that the phase measurement system by using three-line CCD has high application values for its high precision and speed.
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Hong Zhao, Hong Zhao, Zhihua Zhao, Zhihua Zhao, Kejian Jiang, Kejian Jiang, Yuanhe Song, Yuanhe Song, } "A novel phase measurement profilometry based on linear CCD array", Proc. SPIE 5852, Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics, (12 April 2005); doi: 10.1117/12.621463; https://doi.org/10.1117/12.621463
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