Paper
13 June 2005 Object surface topography by means of a speckle correlation
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Abstract
In this paper we present an optical method based on speckle pattern correlation for measurement of the topography of a surface of an object under investigation. When this object is illuminated with coherent laser beam the arising speckle pattern bears information about the height profile of the object. The resolution of this method is influenced by geometrical parameters of optical measurement set-up. The designed experimental set-up for the measurement of the slope of the object with rough surface is described. Achieved results are presented in comparison with theoretic values.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Petr Smid, Pavel Horvath, Petra Wagnerova, and Miroslav Hrabovsky "Object surface topography by means of a speckle correlation", Proc. SPIE 5856, Optical Measurement Systems for Industrial Inspection IV, (13 June 2005); https://doi.org/10.1117/12.618634
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KEYWORDS
Speckle pattern

Speckle

CCD cameras

Sensors

Aluminum

Optical testing

Image sensors

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