13 June 2005 Utilizing a TII aspherical measurement machine in a computer controlled polishing process
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Abstract
The demand on quality of optical surfaces is increasing from year to year. Computer controlled polishing is one way to fulfill these demands. The process depends on the error-profile of the optical surface. In this paper the usage of the TII measurement machine is discussed to manufacture optical surfaces.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
E. Pitschke, M. Schinhaerl, P. Sperber, R. Rascher, "Utilizing a TII aspherical measurement machine in a computer controlled polishing process", Proc. SPIE 5856, Optical Measurement Systems for Industrial Inspection IV, (13 June 2005); doi: 10.1117/12.612597; https://doi.org/10.1117/12.612597
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