Translator Disclaimer
13 June 2005 Zeeman laser for straightness measurements
Author Affiliations +
Abstract
In the paper we present the prototype of a straightness measuring device that uses a frequency stabilized Zeeman He-Ne laser. The He-Ne laser line is split by Zeeman effect into two circularly polarized laser beams. The frequency of the radiations differ of 1,2 MHz. The surface stabilized ferroelectric liquid crystal cell is used to stabilize the laser frequency. As the result of the laser frequency stabilization the power of both radiation is equal. The circular polarizations of two laser beams are converted into two linear polarizations perpendicular to each other. The two laser beams pass close to the measured axis. Along the axis the analyzing probe is moved. The analyzing probe changes the ratio of the power of the horizontal to the vertical polarization. This ratio is analyzed by the receiver composed of the ferroelectric liquid crystal switcher, the polarizer and the detector. The straightness of 2 m long optical bench was measured with this techniques. The resolution of 0,1 μm and the accuracy of 0.5 μm were obtained. The accuracy of presented technique is not so good as in the methods using laser interferometer but is comparable with methods using PSD, quadrant detectors or CCD at the same time offering bigger resolution.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Janusz Rzepka, Grzegorz Budzyn, Wojciech Fraczek, and Marcin Bielenin "Zeeman laser for straightness measurements", Proc. SPIE 5856, Optical Measurement Systems for Industrial Inspection IV, (13 June 2005); https://doi.org/10.1117/12.612658
PROCEEDINGS
7 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT

SSFLC for laser frequency stabilization
Proceedings of SPIE (May 12 2000)
Optical Logic Gates Using Ferroelectric Liquid Crystals
Proceedings of SPIE (December 19 1986)
Single-frequency He-Ne laser for linear measurements
Proceedings of SPIE (January 01 1998)

Back to Top