Polarimetry: measurements, error analysis, and application

C. Flueraru; X. Cai; S. Chang

doi:10.1117/12.612648

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26 August 2005 Polarimetry: measurements, error analysis, and application

C. Flueraru; X. Cai; S. Chang

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Proceedings Volume 5858, Nano- and Micro-Metrology; 58580H (2005) https://doi.org/10.1117/12.612648
Event: Optical Metrology, 2005, Munich, Germany

Abstract

A simple polarimeter based upon a quarter wave plate and a polarizer is presented. Rotating the quarter wave plate all Stokes vector components are calculated by processing the intensity variation. The effect of misalignment in the linear polarizer azimuth and the deviation from the π/2 retardance of the quarter wave plate is analytical and experimental investigated. The technique is consolidated by using two algorithms for Stokes vector calculation.

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C. Flueraru, X. Cai, and S. Chang "Polarimetry: measurements, error analysis, and application", Proc. SPIE 5858, Nano- and Micro-Metrology, 58580H (26 August 2005); https://doi.org/10.1117/12.612648

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