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7 October 2005 Sub-resolution axial localization of nanoparticles in fluorescence microscopy
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Abstract
We propose a method for sub-resolution axial localization of particles in fluorescence microscopy, based on maximum-likelihood estimation. Given acquisitions of a defocused fluorescent particle, we can estimate its axial position with nanometer range precision.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Francois Aguet, Dimitri Van De Ville, and Michael Unser "Sub-resolution axial localization of nanoparticles in fluorescence microscopy", Proc. SPIE 5860, Confocal, Multiphoton, and Nonlinear Microscopic Imaging II, 58600P (7 October 2005); doi: 10.1117/12.643899; https://doi.org/10.1117/12.643899
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