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18 August 2005 Sub-aperture interferometric testing of a large-scale elliptical mirror under thermal-vacuum conditions
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Abstract
Interferometric testing of large-sized optics in a thermal vacuum environment poses challenges not normally found in an optical metrology lab. Unless the test equipment is thermal-vacuum compatible, it must be installed in an ambient environment with the test item viewed through a window in the thermal-vacuum chamber. Limitations in chamber port size preclude normal-incidence viewing of the full aperture of large-sized optical elements. This necessitates the use of a mechanical translation of the test item to acquire multiple overlying interferograms. The interferograms are then concatenated in order to produce a full-aperture surface map of the test item. This is then used to confirm surface deformation of the entire test mirror. This paper will discuss the challenges, solutions, and results of a series of thermalvacuum tests performed on a large-scale (>40cm) silicon carbide mirror at ambient temperatures.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James N. Howell, Richard T. Summers, Michael G. Dittman, Kevin Weed, Robert M. Bates, Peter T. Spuhler, and Wayne Pierre "Sub-aperture interferometric testing of a large-scale elliptical mirror under thermal-vacuum conditions", Proc. SPIE 5869, Optical Manufacturing and Testing VI, 586910 (18 August 2005); https://doi.org/10.1117/12.614934
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