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18 August 2005 Sub-aperture interferometric testing of a large-scale elliptical mirror under thermal-vacuum conditions
James N. Howell; Richard T. Summers; Michael G. Dittman; Kevin Weed; Robert M. Bates; Peter T. Spuhler; Wayne Pierre
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Proceedings Volume 5869, Optical Manufacturing and Testing VI; 586910 (2005) https://doi.org/10.1117/12.614934
Event: Optics and Photonics 2005, 2005, San Diego, California, United States
Abstract
Interferometric testing of large-sized optics in a thermal vacuum environment poses challenges not normally found in an optical metrology lab. Unless the test equipment is thermal-vacuum compatible, it must be installed in an ambient environment with the test item viewed through a window in the thermal-vacuum chamber. Limitations in chamber port size preclude normal-incidence viewing of the full aperture of large-sized optical elements. This necessitates the use of a mechanical translation of the test item to acquire multiple overlying interferograms. The interferograms are then concatenated in order to produce a full-aperture surface map of the test item. This is then used to confirm surface deformation of the entire test mirror. This paper will discuss the challenges, solutions, and results of a series of thermalvacuum tests performed on a large-scale (>40cm) silicon carbide mirror at ambient temperatures.
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James N. Howell, Richard T. Summers, Michael G. Dittman, Kevin Weed, Robert M. Bates, Peter T. Spuhler, and Wayne Pierre "Sub-aperture interferometric testing of a large-scale elliptical mirror under thermal-vacuum conditions", Proc. SPIE 5869, Optical Manufacturing and Testing VI, 586910 (18 August 2005); https://doi.org/10.1117/12.614934
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