31 August 2005 Specific photometer for large coated optics
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Abstract
This paper presents an overview of a photometer developed by CEA to characterize large coated optics (up to 800 x 400 mm2).
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gael Gaborit, Gael Gaborit, Eric Lavastre, Eric Lavastre, Isabelle Lebeaux, Isabelle Lebeaux, Jean-Christophe Poncetta, Jean-Christophe Poncetta, "Specific photometer for large coated optics", Proc. SPIE 5878, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II, 58781A (31 August 2005); doi: 10.1117/12.613900; https://doi.org/10.1117/12.613900
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